The Helios NanoLabTM 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeamTM platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and highest quality sample preparation.
FEI Helios NanoLab 660 - University of Nebraska–Lincoln
The Helios NanoLab™ 660 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeam™ platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and highest quality sample preparation.
FEI Helios 660 Focused Ion Beam-Scanning Electron Microscope
The FEI Helios 660 Focus Ion Beam Scanning Electron Microscope (FIB-SEM) is a workhorse for both radiological and non-radiological material sample preparation and analysis in energy, environment, and national security research.
Helios 5 DualBeam| 用FIB-SEM进行 S/TEM 成像和原子探 …
原子探针断层扫描 (apt) 提供材料的原子分辨率 3d 组成分析。聚焦离子束 (fib) 显微镜是一项为 apt 表征进行高质量、定向和特定样品制备的基本技术。 了解更多 ›
NanoFab Tool: FEI Helios NanoLab 660 Dual Beam Scanning Electron ...
2016年7月1日 · The FEI Helios 660 dual-beam microscope combines a monochromated field emission scanning electron microscope (FE-SEM) with an advanced focused ion beam (FIB) column for fast, precise nanomachining and nanoscale structural characterization.
Helios 660 SEM/FIB - Rice University
The FEI Helios NanoLab 660 DualBeam system integrates advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with plasma cleaner, Gas Injection System (GIS) and the FEI EasyLift NanoManipulator.
FEI Helios Nanolab 660 FIB-SEM – The Advanced Science …
The FEI Helios NanoLab 660 features the most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. This DualBeam SEM/FIB is designed for demanding nanoscale work, resolving the finest details (extremely high resolution) in 2D and 3D with clearest contrast, nanoprototyping, and highest ...
Focused Ion Beam Scanning Electron Microscope (Helios 660)
2011年10月21日 · The Helios 660 NanoLab (HNL660) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements to be performed at high spatial resolution. The HNL660 operates between 1 keV and 30 keV electron beam energy and 2 kV and 30 kV ion beam accelerating voltage.
Microscope: FEI Helios SEM/FIB - Rice University
The FEI Helios NanoLab 660 DualBeam system integrates advanced scanning electron microscope (SEM) and focused ion beam (FIB) technologies with plasma cleaner, Gas Injection System (GIS) and the FEI EasyLift NanoManipulator.
FEI Helios NanoLab 660 Extreme High Resolution Dual Beam FIB
Capabilities and characteristics of the UH Helios 660 dual beam FIB: Electron beam resolution of 0.6 nm at 15 kV, 0.9 nm at 5 kV and 1.2 nm at 1 kV at coincident point.