Abstract As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex ...

Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...

College of Chemistry, Research Institute of Photocatalysis, State Key Laboratory of Photocatalysis on Energy and Environment, Fuzhou University, Fuzhou, Fujian 350108, China College of Chemistry, ...

Global Zero Emission Research Center (GZR), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba West, 16-1, Onogawa, Tsukuba, Ibaraki 305-8569, Japan ...