Cameca LEAP 4000X HR Materials characterization Creates atomic mapping / imaging Microscopy and Characterization Suite (MaCS) Dual Beam Focused Ion Beam Microscope (FIB) Scanning Electron Microscope ...

ZEISS Crossbeam 550 Samplefab uses the Gemini 2 electron column, allowing the operator to observe the sample live with the ...

The solid electrolyte interface (SEI) in lithium-ion (Li-ion) batteries is essential for calculating a battery’s capacity and ...

Traditionally, X-ray methods require at least 10,000 atoms to generate a detectable signal. This is because the X-ray signal ...

Abstract: This paper explores the possibility of enhancing the capability of static random access memories (SRAMs) as heavy ion beam detectors starting from the multiple-cell upsets (MCUs) measured in ...

The company manufactures the desktop LVEM5 electron microscope. Fibics provides analysis solutions to semiconductor and materials science / metallurgy clients, specializing in focused ion beam (FIB), ...

Directed atomic fabrication using an aberration-corrected scanning transmission electron microscope (STEM) opens new pathways for atomic engineering of functional materials. In this approach, the ...