(Image: A. Carlson, Wikimedia Commons, in the public domain) Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) are both essential for analyzing material surfaces, offering ...

Description: ISO/TR 18394:2006 provides guidelines for identifying chemical effects in X-ray or electron-excited Auger-electron spectra and for using these effects in chemical characterization.

The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...

The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...

We actually had the bullet from the process. The Auger hot electrons that we measure are the ones that physically were involved in the non-radiative recombination process.” One of the big surprises in ...

EDS (Energy-dispersive X-ray spectroscopy) and Auger spectrometry come to mind. Another interesting use is to collect secondary electrons emitted from a CPU running a loop. If you collect the ...

These signals include elastically scattered electrons carrying structure information, inelastically scattered electrons and X-rays providing chemical information, and secondary and Auger electrons ...

With this system, the high-speed electron motion induced by Auger process and chemical reaction is recorded as continuous snap shots. In addition, the technique to steer electron motion in materials ...

They propose that the electron trapping in their system occurs through a process called Auger-assisted ionization ... rather than just optical spectroscopy, the photoconductivity measurements ...