What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...
Ion milling systems fire argon ions at samples until they are thin enough to achieve electron transparency. The ions bombard the material from an angle and sputter it from the surface. A transmission ...
The Nordiko 7000 broad ion beam milling system is a fully automatic large area equipment. Equipped with an rf excited ion source, providing low divergence ion beams from 15 to 25 cm diameter.
Building on twenty years of experience in delivering RF based ion beam systems Nordiko introduces the α120. This laboratory system comprises a vacuum process module, mounted on a cabinet housing ...
Ion beam (IB) guns and electron beam (EB) guns are devices that emit charged particles (ions and electrons, respectively) directed in a beam which are used in surface analysis or preparation, particle ...
Surfaces of cross-sections can also be polished (flat milling) where several nano-metres of material is removed. Suitable for making deformation-free surfaces for e.g. EBSD (Electron Beam Scattering ...
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