Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions ... Future advancements in FIB milling will focus on improving the resolution, throughput, and ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Helios 5 Hydra DualBeam (plasma ...

Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt ...

a unique heavy-ion Radio-Frequency Quadrupole (RFQ) to focus and bunch the ions and a high-power target and beam dump to ...