The electron microscopy techniques of widefield, laser scanning and focussed ion beam scanning electron microscopy are all connected. At the same time, maintain the adaptability of a multi-purpose FIB ...

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...

equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt Low-background EDS Holder Gatan 626 Cryo Holder Gatan High Field-of-view Single-tilt Tomography Holder ...

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The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy. Formerly Visual SI Advanced ...

The CRYO-FIB-SEM has a built-in sputter coating function ... by Linkam Scientific Instruments* and a fluorescence microscope manufactured by Nikon Solutions*. The stage coordinates of each ...

The Thermo Fisher Apreo 2 Variable Pressure Field Emission Scanning Electron Microscope (FE-SEM) is a thermionic field emission high resolution scanning electron microscope. The Apreo 2 FE-SEM is an ...

The Electron Imaging and Holography Facility has become the Helium Ion Microscopy Facility. Two of the previous major microscopes (SEM/FIB and Tecnai F20) were sold or retired. The feasibility of ...

Using Raman imaging and scanning electron microscopy, ultra-structural surface properties can be connected to molecular compound information. The combination of Raman spectrometry and SEM imaging ...

ZEISS Crossbeam 550 Samplefab uses the Gemini 2 electron column, allowing the operator to observe the sample live with the ...