Peabody, MA ---JEOL is pleased to announce the introduction of a new CRYO-FIB-SEM, a Focused Ion Beam milling specimen preparation tool specifically designed for creating thin, frozen samples for ...

With our cryogenic electron microscopy, or cryo-EM ... We offer consultation, training and specimen preparation for transmission and scanning electron microscopy, or TEM and SEM. Our equipment ...

Taking this a step further, the NPL and Keysight Technologies collaborated on a research project, exploring RF power at cryogenic temperatures. This resulted in the world's first successful ...